- Pickering Interfaces Inc.
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PXI/PXIe Wide Current Range Multiplexer Module, Single 6-Channel, 4-Pole
40-514-102
The 40-514-102 (PXI) and 42-514-102 (PXIe) are low density multiplexers in single 6-channel, 4-pole configuration. They are capable of switching a wide range of current, from 10 μA to 2.5 A at 220 VDC/250 VAC. The current capability of the module permits the use of a single module type for both low and medium current test applications.
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Avalanche Photodiodes
Excelitas offers Avalanche Photodiodes (APDs) on both Silicon (Si) and InGaAs materials. Si APDs cover the spectral range of 400 nm to 1100 nm and the InGaAs APDs cover 950 nm to 1550 nm. An Avalanche Photodiode (APD) provides higher sensitivity than a standard photodiode and is for extreme low-level light (LLL) detection and photon counting.
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10G APD Photodiodes
Macom Technology Solutions Holdings Inc.
MACOM offers the highest sensitivity avalanche photodiodes (APD) on the market to satisfy 10Gtelecom and datacom applications. Both front-illuminated and back-illuminated chips are available and usable from 1250 to 1650 nm for bit rates up to 11.3 Gb/s. Proprietary designs enable superior bandwidth, excellent temperature stability and high reliability to support market needs.
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Fiber Photodiode Power Sensors
These interfaces provide communication between an attached sensor and a PC or other external control unit. They are designed to be controlled via an external device or operated autonomously using the analog output; there are no controls or display screens.
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Pyranometer with Silicon Photodiode
LP471SILICONPYRA
Pyranometer with silicon photodiade for GLOBAL SOLAR IRRADIANCE measurement.
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25G APD Photodiodes
Macom Technology Solutions Holdings Inc.
MACOM offers the highest sensitivity avalanche photodiodes (APD) on the market to satisfy 28G related applications. The chips are usable from 1250 to 1650 nm for bit rates up to 28 Gb/s and 28 GBd. Proprietary designs enable superior bandwidth, excellent temperature stability and high reliability to support market needs of PAM-4 and 400G Ethernet applications.
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Photodiodes
Opto Diode manufactures high quality standard and custom photodiodes. Our wide range of standard device feature low dark current and low capacitance. The silicon detectors are ideal for general purpose applications, laser monitoring, position sensing, measuring photons, electrons, or X-rays, or for detecting sun and rain applications. The devices operate from the deep UV to the near-infrared wavelengths.
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Design for Test
Test Coach offers Design for Test (DFT) consulting to assist customers with design review of prototype boards prior to release for production. Design for Test analysis is extremely important in ensuring that an assembly will achieve the highest possible test coverage. For ICT, this DFT will review the board to confirm that the bed-of-nails test fixture can be fabricated to test an assembly without sacrificing test coverage. As with ICT, Flying Probe benefits from DFT analysis by reviewing test p...show more -
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Test Socket
Our test sockets are made for high performance and are of top quality, to guarantee a smooth, effortless process. We believe in providing our partners and customers with effective and intelligent solutions that they can apply with ease. Choose the solutions of TTS Group cater to the needs of detailed and complex systems.
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Photodiodes
Photodiodes are a type of detector, devices that generate an electrical signal when illuminated by light. ACP offers a variety of different types of photodiodes, including InGaAs PIN photodiodes.
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Full Range Photodiode Array UV-VIS-NIR-SWIRLaboratory Spectroradiometers
The SR-Series of full range laboratory spectroradiometers is ideal for a wide range of applications, including:*Solar radiance and irradiance measurements*Solar simulator test and classification*LED, laser, light source metrology*Radiometric calibration transfer*Remote sensing applications
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50/100G PAM4 Pin Photodiodes
Macom Technology Solutions Holdings Inc.
MACOM offers high sensitivity PIN photodiodes with industry leading performance at speeds of 56Gbd / 100G. Proprietary designs enable operation using PAM4 modulation protocols in 50 /100G applications. The high responsivity designs have high reliability and are suitable for use in both tele-communications and datacenter networks. The high bandwidth PIN photodetectors are available in a back illuminated design (highest performance), a front illuminated design (more cost effective) and in both singlet and array form factors
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Universal Test Fixture
CAM/GATE
The Low Cost Solution for Accurate and Dependable Universal Functional TestThe CAM/GATE ® Universal Test Fixture System is your afforable, efficient solution for functional test. No need to have multiple fixtures in your test area...
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Photodiodes
Avalanche
Similar to photomultipliers, avalanche photodiodes are used to detect extremely weak light intensities. Si APDs are used in the wavelength range from 250 to 1100 nm, and InGaAs is used as semiconductor material in APDs for the wavelength range from 1100 to 1700 nm.
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Semiconductor Test Hardware Solutions
A critical element of every semiconductor test solution is the interface between the device and ATE. The hardware team at Test Spectrum has produced thousands of successful test interface solutions for some of the most challenging semiconductor products on all major ATE platforms. Our in-house team of PCB design experts has an added advantage of direct access to our senior test engineering staff.
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Test Fixtures
At Global Test Services LP, we know that verifiable yields are the backbone of your business, which is why we offer innovative, robust solutions that offer you better availability, improve efficiency, and offer flexible, scalable systems that meet the specific quality and test needs of your business.
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Emulate Test in simulation
STIL-VT
Emulate test patterns in simulation environment with DUT simulation model. The simulation allows pre-silicon debug of test patterns. Reads the intermediate STIL format of tester patterns and creates a Verilog /VHDL simulation test bench. (A sub-set of Virtual tester solution)
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Four-module test set
F8200
Use the F8200 Power System Simulator for testing single-phase conventional schemes, digital protection systems, and more. This four-module F8000-series instrument is available in four standard configurations of HVA Current, HVA Voltage, and Low-Density Logic I/O modules.
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Battery Test & Management
Kongter Test & Measurement Co., Limited
Kongter offers a whole line of products for testing and measurement of battery from your critical power systems. It includes battery online monitoring system, battery tester for internal resistance/conductance, battery charger, battery load bank, battery data logger, battery charger/discharger and so on.
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Semicon Test Probes
Fine pitch, 0.20 mm [8 Mil] - single & double ended - non-rotating - kelvin - RF - high performance.
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Environmental Test Chambers
Angelantoni Test Technologies Srl
We supply a wide range of climatic chambers capable of reproducing a very large number of simulated environmental conditions, which can be combined in some cases. Select the type of test and the area of application and you will find the right solution for your needs!
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Meter Test & Calibration
Kongter Test & Measurement Co., Limited
Kongter offers a whole line of products for meter test and calibration including portable power source, standard reference meter and meter test system. All products are accredited to the highest production standards with different options of measurement accuracy (class 0.05 and class 0.1).These enable them to cover different applications for test and calibration of different types of energy meters, electric transducers, indicating meters and so on.
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BARE BOARD TEST PROBES
Probe Technical DataMechanicalMINIMUM CENTERS: .100 (2.54)FULL TRAVEL: .160 (4.06)WORKING TRAVEL: .107 (2.72)OPERATING LIFE: 1,000,000 cyclesElectricalMAXIMUM CURRENT: 5 amps continuousat working travel, non-inductiveRESISTANCE: At 35 mA test current60 18 mOHMS mean63 60 mOHMS meanMaterials and FinishesPLUNGER: Heat treated beryllium copper60 24 Kt gold plated over nickel63 24 Kt gold plated over nickelBARREL: Nickel silver60 24 Kt gold plated ID and OD over nickel63 No FinishSPRING: Music Wire, 24 Kt gold platedover nickel
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Railroad Test Sets
Triplett Test Equipment & Tools
Railroad Testers are designed to perform standard maintenance tasks (using Volts, Ohms, and Amps measurements) as well as specialized tasks requiring measurements on railroad coding equipment. The 2000 Series is compatible with older test technologies and offers test features not found on earlier test sets.
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TRIO Test System
*ICT FCT LED *Perfect & Cost Effective Technical Solution for Electronics manufacturers
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Shock Test System
Labtone Test Equipment Co., LTD
Products are inevitably affected by impact, bump, free fall, tumbling etc. during production, transportation, loading and unloading as well as during the use of the products. All of these are transient excitation on the object, causing the object to produce mechanical characteristics of high speed, acceleration, strain rate instantly. These kind of characteristics are completely different from that in static load, and may cause problems to the object in terms of structural strength and stability...show more -
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Full Wafer Test System
FOX-1P
Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern da...show more
